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A magnification series of a
snow crystal using a low temperature
scanning electron microscope with
magnification up to 100,000X, compared to 30X – 500X available with a light
microscopes. Snow samples are very fragile and exposure to the light necessary to photograph them, using light microscopes, can damage the crystals and even melt them. A low temperature SEM operating at -170°C avoids disturbing the structure. Photo credit:
USDA Beltsville Agricultural Research Unit |
![]() |
A magnification series of a
snow crystal using a low temperature
scanning electron microscope with
magnification up to 100,000X, compared to 30X – 500X available with a light
microscopes. Snow samples are very fragile and exposure to the light necessary to photograph them, using light microscopes, can damage the crystals and even melt them. A low temperature SEM operating at -170°C avoids disturbing the structure. Photo credit:
USDA Beltsville Agricultural Research Unit |