Time-dependent dielectric breakdown (or
Time-dependent gate oxide breakdown), a failure mechanism in
MOSFETs, when the
gate oxidebreaks down as a result of long-time application of relatively low electric field (as opposite to immediate breakdown, which is caused by strong electric field)
Topics referred to by the same term
This
disambiguation page lists articles associated with the title TDDB. If an
internal link led you here, you may wish to change the link to point directly to the intended article.
Time-dependent dielectric breakdown (or
Time-dependent gate oxide breakdown), a failure mechanism in
MOSFETs, when the
gate oxidebreaks down as a result of long-time application of relatively low electric field (as opposite to immediate breakdown, which is caused by strong electric field)
Topics referred to by the same term
This
disambiguation page lists articles associated with the title TDDB. If an
internal link led you here, you may wish to change the link to point directly to the intended article.