English: An Electroglas 4090μ+ semiconductor
wafer prober in service configuration, with test head,
probe card, cover panels and other accessories removed. Internal parts are shown; the
linear motor and platen, chuck and stage and material handling elements are shown.
to share – to copy, distribute and transmit the work
to remix – to adapt the work
Under the following conditions:
attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
share alike – If you remix, transform, or build upon the material, you must distribute your contributions under the
same or compatible license as the original.
English: An Electroglas 4090μ+ semiconductor
wafer prober in service configuration, with test head,
probe card, cover panels and other accessories removed. Internal parts are shown; the
linear motor and platen, chuck and stage and material handling elements are shown.
to share – to copy, distribute and transmit the work
to remix – to adapt the work
Under the following conditions:
attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
share alike – If you remix, transform, or build upon the material, you must distribute your contributions under the
same or compatible license as the original.